NIEF hosted a two-day workshop in the visualization and analysis of fluorescence-based images using NIS Elements software, a microscopy image analysis software. In the first day, a series of imaging applications were covered: visualization in 2D and 3D, automated measurements, high‐throughput analysis, particle tracking, volumetric measurements, deconvolution, and spectral analysis. In the second day, short one-on-one sections were offered to the participants to analyze their images and clarify doubts.
